Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2008-05-27
2011-11-29
Stafira, Michael P (Department: 2886)
Image analysis
Applications
Manufacturing or product inspection
Reexamination Certificate
active
08068660
ABSTRACT:
System and method for characterizing vision systems. A multi-dimensional condition space is provided, each dimension representing a respective condition axis, where each point in the condition space specifies a set of conditions under which a vision system may operate. An image is provided. The condition space is sampled according to a pseudo-random sequence, e.g., a low-discrepancy sequence, to determine a plurality of test conditions usable to characterize the vision system, where each test condition corresponds to a respective set of conditions. A plurality of test images corresponding to the plurality of test conditions are generated based on the image, e.g., by applying image processing functions to the image that simulate the test conditions. A vision inspection is performed on each of the plurality of test images to generate respective test results, and the test results are analyzed to determine conditions under which the vision system operates correctly.
REFERENCES:
patent: 2003/0007690 (2003-01-01), Rajagopal et al.
patent: 2003/0179922 (2003-09-01), Peters et al.
patent: 2006/0204121 (2006-09-01), Bryll
patent: 2007/0146491 (2007-06-01), Tremblay et al.
Giesen Robert J. B.
Keeler Joshua B.
Nair Dinesh R.
Smyth Bruce
Vazquez Nicolas
Hood Jeffrey C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
National Instruments Corporation
Stafira Michael P
Stevens Joel L.
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