Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-04-15
2008-04-15
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S067000, C702S068000, C702S069000, C702S070000, C702S071000, C345S440100
Reexamination Certificate
active
07359810
ABSTRACT:
A method of characterizing a newly acquired waveform with respect to previously acquired waveforms during monitoring of a generally repetitive signal, where the previously acquired waveforms have been rasterized into a two-dimensional array of memory locations, reads history values for those memory locations associated with an active portion of the newly acquired waveform, compares the history values with history value ranges, increments a count for one of a plurality of recent pixel counters corresponding to the history value ranges, each counter having a different history value range, and modifies the history values in the memory locations. From the counts accumulated for each of the history value ranges the variability of the newly acquired waveform from the generally repetitive signal is determined.
REFERENCES:
patent: 6163758 (2000-12-01), Sullivan et al.
patent: 6493400 (2002-12-01), Greeley et al.
patent: 2002/0180737 (2002-12-01), Letts
Dobyns Kenneth P.
Gerlach Paul M.
Letts Peter J.
Veith Kristie
Gray Francis I.
Huynh Phuong
Lenihan Thomas F.
Tektronix Inc.
Wachsman Hal
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