Data processing: measuring – calibrating – or testing – Testing system
Reexamination Certificate
2008-09-09
2008-09-09
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Reexamination Certificate
active
10996579
ABSTRACT:
Systems and methods of characterizing eye diagrams are described. In one aspect, at measurement times across a measurement interval spanning at least one unit interval of the input signal, corresponding levels of the input signal are classified into groups based on at least one threshold. An eye diagram characteristic width is derived based on a distribution across the measurement interval of the levels in one of the groups.
REFERENCES:
patent: 4707840 (1987-11-01), Nakayama
patent: 5309157 (1994-05-01), Yee
patent: 5319372 (1994-06-01), Yee
patent: 5323423 (1994-06-01), Townsend et al.
patent: 5333147 (1994-07-01), Nohara et al.
patent: 5392045 (1995-02-01), Yee
patent: 6546063 (2003-04-01), Lee et al.
patent: 6768703 (2004-07-01), Nygaar, Jr. et al.
patent: 6784653 (2004-08-01), Baumert
patent: 2002/0060820 (2002-05-01), Buchali
patent: 2002/0133730 (2002-09-01), Zabinski et al.
patent: 2003/0043900 (2003-03-01), Deas et al.
patent: 2003/0048859 (2003-03-01), Wedding
patent: 2004/0066867 (2004-04-01), Fujimori et al.
patent: 2005/0058234 (2005-03-01), Stojanovic
patent: 1292078 (2003-12-01), None
Ellermeyer et al., “A 10 Gb/s Eye-Opening Monitor IC for Decision-Guided Adaptation of the Frequency Response of an Optical Receiver,” IEEE Journal of Solid-State Circuits, vol. 35, No. 12 (Dec. 2000), p. 1958-1963.
“Eye Measurements on Optical RZ Signals,” Tektronix, Technical Brief, www.tektronix.com/optical (2002), p. 1-12.
Corrected International Search Report dated Aug. 22, 2006 from corresponding PCT patent aplication No. PCT/US05/38594.
Holzlohner, Ronald, Accurate calculation of eye diagram and bit error rates in optical transmission system using linearization, Mar. 2002, pp. 389-400.
Galloway Brian J.
Nishimura Ken A.
Steinbach Gunter
Agilent Technologie,s Inc.
Lau Tung S
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