Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means
Patent
1987-10-21
1989-04-04
Anderson, Bruce C.
Radiant energy
Ionic separation or analysis
Ion beam pulsing means with detector synchronizing means
250281, 250282, H01J 4940
Patent
active
048188620
ABSTRACT:
An apparatus for characterizing the mass of sample and daughter particles, comprising a source for providing sample ions; a fragmentation region wherein a fraction of the sample ions may fragment to produce daughter ion particles; an electrostatic field region held at a voltage level sufficient to effect ion-neutral separation and ion-ion separation of fragments from the same sample ion and to separate ions of different kinetic energy; a detector system for measuring the relative arrival times of particles; and processing means operatively connected to the detector system to receive and store the relative arrival times and operable to compare the arrival times with times detected at the detector when the electrostatic field region is held at a different voltage level and to thereafter characterize the particles. Sample and daughter particles are characterized with respect to mass and other characteristics by detecting at a particle detector the relative time of arrival for fragments of a sample ion at two different electrostatic voltage levels. The two sets of particle arrival times are used in conjunction with the known altered voltage levels to mathematically characterize the sample and daughter fragments. In an alternative embodiment the present invention may be used as a detector for a conventional mass spectrometer. In this embodiment, conventional mass spectrometry analysis is enhanced due to further mass resolving of the detected ions.
REFERENCES:
patent: 3767914 (1973-10-01), Mueller et al.
patent: 4072862 (1978-02-01), Mamyrin et al.
patent: 4136280 (1979-01-01), Hunt et al.
patent: 4439395 (1984-03-01), Kim
patent: 4458149 (1984-07-01), Muga
patent: 4472631 (1984-09-01), Enke et al.
patent: 4611118 (1986-09-01), Managadze
Yost and Enke, An Added Dimension for Structure Elucidation Through Triple Quadruple MS, American Laboratory (Jun. 1981) pp. 88-95.
Wood, Edwards and Steuer, Time-of Flight Energy Spectrometer for Positive Ions, Rev. Sci. Instrum., vol. 47, No. 12 (Dec. 1976) pp. 1471-1474.
Negra and Le Beyec, A .sup.252 Cf Time-of-Flight Mass Spectrometer with Improved Mass Resolution, International Journal of Mass Spectrometry and Ion Processes, vol. 61 (1984) pp. 21-29.
Anderson Bruce C.
Berman Jack I.
Iowa State University & Research Foundation, Inc.
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