Characterization of a scan line produced from a facet of a...

Incremental printing of symbolic information – Light or beam marking apparatus or processes – Scan of light

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C347S250000

Reexamination Certificate

active

11189174

ABSTRACT:
A method for refining a length of a scan line, where the scan line is produced from a facet of a scanning device. The method includes the steps of: (a) acquiring a plurality of scan line lengths produced from the facet, (b) determining from the plurality of scan line lengths, an average scan line length for the facet, and (c) determining from the average scan line length, a scan line length correction for the facet. A method for measuring a length of a scan line includes the steps of: (a) charging an electrical current integrator to a voltage while a scan line is produced from a facet, (b) measuring the voltage, and (c) determining from the voltage, the length of the scan line produced from the facet.

REFERENCES:
patent: 4622593 (1986-11-01), Curry
patent: 4950889 (1990-08-01), Budd et al.
patent: 4962981 (1990-10-01), Murakami et al.
patent: 5049752 (1991-09-01), Kalaf et al.
patent: 5790480 (1998-08-01), Klatser
patent: 5966231 (1999-10-01), Bush et al.
patent: 5991008 (1999-11-01), Li et al.
patent: 6351277 (2002-02-01), Skillman
patent: 6396561 (2002-05-01), Vernackt et al.
patent: 62071888 (1987-04-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Characterization of a scan line produced from a facet of a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Characterization of a scan line produced from a facet of a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Characterization of a scan line produced from a facet of a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3798675

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.