Characteristic measuring apparatus for electronic components

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S758010, C324S1540PB, C209S573000

Reexamination Certificate

active

07030634

ABSTRACT:
An apparatus for measuring the electrical characteristic of a chip-shaped electronic component having first and second external terminal electrodes at first and second opposing ends thereof includes a holder that holds an electronic component with the first and second external terminal electrodes pointing toward first and second open ends of a receiving cavity. The holder is provided with a shield layer extending between first and second measuring terminals, and the shield layer is electrically connected to a measurement reference potential. The shield layer reduces the stray parasitic capacitance adjacent to the electronic component, and reduces measurement errors resulting from size variations of the electronic component.

REFERENCES:
patent: 5034749 (1991-07-01), Jungblut et al.
patent: 5842579 (1998-12-01), Garcia et al.
patent: 6040705 (2000-03-01), Garcia et al.
patent: 6204464 (2001-03-01), Garcia et al.
patent: 6479777 (2002-11-01), Yamakawa
patent: 6714028 (2004-03-01), Garcia et al.
patent: 02-195272 (1990-08-01), None
patent: 08-122386 (1996-05-01), None
patent: 2000-501174 (2000-02-01), None
patent: WO 01/10575 (2001-02-01), None
Official Communication issued in the corresponding Korean Application No. 10-2004-7004210 dated Oct. 31, 2005, Total 5 pages.

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