Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-04-18
2006-04-18
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S758010, C324S1540PB, C209S573000
Reexamination Certificate
active
07030634
ABSTRACT:
An apparatus for measuring the electrical characteristic of a chip-shaped electronic component having first and second external terminal electrodes at first and second opposing ends thereof includes a holder that holds an electronic component with the first and second external terminal electrodes pointing toward first and second open ends of a receiving cavity. The holder is provided with a shield layer extending between first and second measuring terminals, and the shield layer is electrically connected to a measurement reference potential. The shield layer reduces the stray parasitic capacitance adjacent to the electronic component, and reduces measurement errors resulting from size variations of the electronic component.
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Official Communication issued in the corresponding Korean Application No. 10-2004-7004210 dated Oct. 31, 2005, Total 5 pages.
Keating & Bennett LLP
Murata Manufacturing Co. Ltd.
Patel Paresh
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