Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2007-04-10
2007-04-10
Dickey, Thomas (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S002000, C257SE31029
Reexamination Certificate
active
11001424
ABSTRACT:
A chalcogenide phase change memory cell has a substrate with a conductor line. The conductor line has a contact end. An insulating layer is located over the substrate and conductor line. An aperture is located in the insulating layer. The aperture extends to the substrate. A memory material is conformally located within the aperture. The memory material is in electrical contact with the contact end. A conductive layer is located over the memory material in the aperture.
REFERENCES:
patent: 6031287 (2000-02-01), Harshfield
patent: 6111264 (2000-08-01), Wolstenholme et al.
patent: 6114713 (2000-09-01), Zahorik
patent: 6189582 (2001-02-01), Reinberg et al.
patent: 6781145 (2004-08-01), Doan et al.
patent: 6795338 (2004-09-01), Parkinson et al.
Dickey Thomas
Liu Benjamin Tzu-Hung
Macronix International Co., Inc.
Stout, Uxa Buyan & Mullins, LLP
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