Ceramic plate for a semiconductor producing/inspecting...

Electric heating – Heating devices – Combined with container – enclosure – or support for material...

Reexamination Certificate

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C118S724000

Reexamination Certificate

active

06884972

ABSTRACT:
A ceramic heater for a semiconductor producing/examining device including a ceramic substrate having a disc form with a diameter exceeding 200 mm and first and second surfaces, the first surface being a wafer-holding face and the second surface opposing to the first surface, the wafer-holding face being such that a semiconductor wafer is directly put on the wafer-holding face or held apart from the wafer-holding face by a supporting pin. The wafer-holding face has a surface roughness Rmax of 0.1 to 250 μm according to JIS R 0601, and a difference between the surface roughness of the wafer-holding face and surface roughness of the second surface is 50% or less.

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Material Processing Data File No. 1295 With partial English translation.
Material Processing Data File No. 3573 With partial English translation.
Material Processing Data File No. 3564 With partial English translation.
Reference Material 1 With partial English translation.
Reference Material 2 With

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