Electric heating – Heating devices – Combined with container – enclosure – or support for material...
Reexamination Certificate
2005-04-12
2005-04-12
Paik, Sang (Department: 3742)
Electric heating
Heating devices
Combined with container, enclosure, or support for material...
C219S448110, C219S544000
Reexamination Certificate
active
06878906
ABSTRACT:
An object of the present invention is to provide a ceramic heater for a semiconductor producing/examining device which is capable of accurately measuring the temperature of an object to be heated and evenly heating the whole body of a silicon wafer by adjusting the heating state of a heating element based on the temperature measurement result, and the ceramic heater for a semiconductor producing/examining device of the present invention is a ceramic heater including a ceramic substrate and a heating element formed on the surface or the inside of the ceramic substrate, wherein a temperature measurement element is formed while being brought into contact with the ceramic substrate and the surface roughness of the ceramic substrate brought into contact with the temperature measurement element is Ra≦5 μm.
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Ito Atsushi
Ito Yasutaka
Ibiden Co. Ltd.
Paik Sang
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