Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2007-07-27
2010-02-16
Le, Vu A (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185220
Reexamination Certificate
active
07663926
ABSTRACT:
Memory devices and methods adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. Warning of cell deterioration can be performed using reference cells programmed in accordance with a known pattern such as to approximate deterioration of non-volatile memory cells of the device.
REFERENCES:
patent: 6061751 (2000-05-01), Bruner et al.
patent: 6084538 (2000-07-01), Kostelnik et al.
patent: 7158335 (2007-01-01), Park et al.
patent: 2005/0162921 (2005-07-01), Kurihara
patent: 2006/0274581 (2006-12-01), Redaelli et al.
patent: 2008/0144388 (2008-06-01), Yamashita
patent: 2008/0175055 (2008-07-01), Kim
patent: 09306182 (1997-11-01), None
patent: 1020040052409 (2004-06-01), None
Hoei Jung-Sheng
Roohparvar Frankie F.
Sarin Vishal
Le Vu A
Leffert Jay & Polglaze P.A.
Micro)n Technology, Inc.
LandOfFree
Cell deterioration warning apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Cell deterioration warning apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Cell deterioration warning apparatus and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4212117