CCD-type solid-state pickup device and its fabrication method

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

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Details

257233, 257249, 257250, 257435, H01L 27148, H01L 29768

Patent

active

060139250

ABSTRACT:
A first silicon oxide film, silicon nitride film, and polycrystalline silicon film are formed on the entire surface of a semiconductor substrate. Then, the polycrystalline silicon film is etched to form a first transfer electrode and then, the surface of the first transfer electrode is thermally oxidized to form a second silicon oxide film. Thereafter, a polycrystalline silicon film and a third silicon oxide film are formed on the entire surface and patterned to form a second transfer electrode. A fourth silicon oxide film is formed on the entire surface, and is etched back. Thereafter, the side wall surfaces of the third silicon oxide film and the second transfer electrode are covered with a fourth silicon oxide film. Thereafter, a light shielding film is selectively formed on them.

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patent: 5493143 (1996-02-01), Hokari
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patent: 5578842 (1996-11-01), Shinji
patent: 5585653 (1996-12-01), Nakashiba
patent: 5619049 (1997-04-01), Kim
patent: 5844289 (1998-12-01), Terrnisha et al.
patent: 5844290 (1998-02-01), Furumiya

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