CCD imager with test structure

Details CCD imager with test structure CCD imager with test structure

1992-06-18

1994-11-29

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324767, G01R 3126

Patent

active

053693574

ABSTRACT:
The present disclosure is directed to an optically operated test structure for a CCD imager for testing for certain components of the imager modulation transfer function. The CCD imager includes a line of imaging photodetectors and a CCD shift register extending along the line of imaging photodetectors. A separate exposure drain region is adjacent each imaging photodetector and an exposure control gate extends between the imaging photodetectors and their respective exposure drain regions. A plurality of test photodetectors are in the line of the imaging photodetectors with at least one imaging photodetector being at each end of the test photodetectors. Each of the test photodetectors has an exposure drain region adjacent thereto, and a test exposure control gate extends between the test photodetectors and their respective exposure drain regions. The test exposure control gate is separate from the exposure control gate for the imaging photodetectors.

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S. P. Emmons et al., "A Low-Noise CCD Input With Reduced Sensitivity to Threshold Voltage", Technical Digest of IEDM, Washington, D.C., Dec. 1974, pp. 233-235.

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