Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1995-05-23
1996-01-09
Gonzales, Frank
Optics: measuring and testing
By particle light scattering
With photocell detection
356358, G01B 902
Patent
active
054833418
ABSTRACT:
In a cavity dispersion measuring method, there are provided the steps of: dividing a light beam emitted from a laser cavity under measurement into first, second, third, and fourth light beams; propagating the first light beam and the second light beam along a first optical path and a second optical path respectively, and superimposing two light beams with each other which have passed through the first and second optical paths respectively to cause the two light beams to interfere with each other, thereby producing a first interference light beam; propagating the third light beam and the fourth light beam along a third optical path whose light path length is variable and a fourth optical path whose light path length is fixed respectively, thereby producing a second interference light beam; controlling the optical path length of the third light path in order that intensity of the second interference light beam is kept constant; adjusting the optical path length of the first optical path in correspondence with the controlled optical path length of the third optical path; measuring the first interference light to obtain a waveform of the light intensity while varying the optical path length of the second optical path in a vicinity; and Fourier-transforming the waveform of the measured light intensity to obtain phase information in a frequency domain, whereby wavelength dispersion of the laser cavity is obtained based on the phase information.
REFERENCES:
"In situ measurement of complete intracavity dispersion in an operating Ti:sapphire femtosecond laser" Knox, Optics Letters, vol. 17, No. 7, Apr. 1, 1992 pp. 514-516.
"Femtosecond Time Domain Measurements of Group Velocity Dispersion in Diode Lasers at 1.5 .mu.m" Hall et al., Journal of Lightwave Technology, vol. 10, no. 5, May 1992, pp. 616-619.
Summaries of papers presented at the Conference on Lasers and Electro-Optics, May 2-7, 1993, Baltimore, Md. Optical Society of America, "Laser-cavity dispersion measurement based on interferometric cross correlation of amplified spontaneous emission" Naganuma, CFB4 pp. 570-573.
"Semiconductor laser cavity dispersion measurement based on interferometric crosscorrelation of amplified spontaneous emission" Naganuma, Appl. Phys. Lett. 64(3) 17 Jan. 1994, pp. 261-263.
Gonzales Frank
Kim Robert
Nippon Telegraph & Telephone Corporation
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