Catadioptric optical system for lithography

Optical: systems and elements – Lens – With reflecting element

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359727, G02B 1700

Patent

active

061010472

ABSTRACT:
Provided with an optical system which is applicable to an exposure apparatus used in the manufacture of semiconductors and includes a combination of a spherical mirror having a function of refraction and lenses for astigmation control, using a CaF.sub.2 lens as the last lens, thereby making it possible to use a light source operating at a short wavelength and a wide bandwidth, enhance the life of the optical system, and transfer the enlarge pattern of a mask onto the wafer for realizing fine line width.

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patent: 5668672 (1997-09-01), Oumura
patent: 5880891 (1999-03-01), Furter
Michael Hibbs, "193-nm lithograph.sub.y at MIT Lincoln Lab", Solid State Technology, Jul. 1995, pp. 69-77.
David Williamson et al., "Micrascan III, 0.25.mu.m resolution step and scan system", SPIE, vol. 2726, pp. 780-786.
Li Li et al., "Visible broadband, wide-angle, thin-film multilayer polarizing beam splitter", Applied Optics, vol. 35, No. 13, May 1, 1996, pp. 2221-2225.

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