Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Reexamination Certificate
2000-07-31
2003-08-12
Cuneo, Kamand (Department: 2829)
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
C324S149000, C324S754090, C439S482000
Reexamination Certificate
active
06605934
ABSTRACT:
BACKGROUND OF THE INVENTION
The present invention relates generally to a cartridge system for a probing head for an electrical test probe, and specifically to a probing head cartridge system that includes a main probing head body and a switchable and replaceable probing tip cartridge.
An electronic test probe generally consists of a probing head, a cable, and a connector. The probing head may have an integral or replaceable probing tip that is suitable for making an electronic contact with electrical components. The probing head is attached to a first end of the cable and the connector is attached to the opposite end of the cable.
Electronic test probes are used to provide an electrical connection between electrical components and testing instruments such as oscilloscopes and other measuring, monitoring, diagnostic, and signal processing instruments. As the size of electrical components decrease, probing tips get smaller.
One type of probing head is a complete unit with an integral, non-replaceable tip. Although this type of probing head provides for an electrical connection with very low resistance, if the tip breaks, the entire head must be replaced. Also, an integral tip limits the user to a single tip unless the user replaces the entire probing head.
Another type of probing head includes a head assembly with a hollow socket that couples with a switchable and replaceable probing tip. One example of this type of probing head is shown in U.S. Design Pat. No. 354,923 to Nightingale. One problem with this socket-type-probing head is that the tips often slide out of the socket. Another problem is that the small tips are easily lost and, once lost, hard to find. Examples of other references that disclose probes with replaceable tips include U.S. Pat. No. 4,552,465, U.S. Pat. No. 4,849,689 to Gleason et al., Japanese Document JP11258270A, and Japanese Patent No. 10282140. In general, these replaceable probing tips are easily broken and, once broken, hard to remove and replace.
U.S. Pat. No. 5,334,931 to Clarke et al. (the “Clarke reference”) sets forth a probing head that may be readily replaced. It is designed with a cantilevered portion that is meant to reduce contact tip breakage. However, if the contact tip does break, it is easy to remove and replace. The Clark reference does not disclose a solution for modern complicated test probes that include expensive electronics and must have little or no inductance.
U.S. Pat. No. 4,209,742 to Bender et al. (the “Bender reference”) is directed to an electrical probe with a modular form of construction for an old technology modular probing head (signal sensing head), a cable with a plug at both ends, and an output termination. One or both plugs are suitable for connecting to the probing head. If the cable is broken, it is simply disconnected at both ends and replaced. Similarly, the probing head can be disconnected and replaced. Because the Bender reference is directed to old technology, it does not disclose a solution for modern complicated test probes that include expensive electronics and must have little or no inductance or capacitance.
BRIEF SUMMARY OF THE INVENTION
The present invention relates generally to a cartridge system for a probing head for an electrical test probe, and specifically to a probing head cartridge system that includes a main probing head body and a switchable and replaceable probing tip cartridge. The body may include a substantial portion of the electronics that make probing heads expensive. Each cartridge would include a fixed tip. However, the cartridges could be made with different types of tips such as a pointed tip, socket tip, or grabber tip. Those embodiments in which the tips are fixed in the cartridge have significantly lower capacitance than designs in which tips are exchanged within the socket.
A cartridge system of the present invention includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. An electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip.
REFERENCES:
patent: 3801766 (1974-04-01), Morrison, Jr.
patent: 4597622 (1986-07-01), Coe
patent: 4701703 (1987-10-01), Malloy
patent: 5061892 (1991-10-01), O'Hara et al.
patent: 5136237 (1992-08-01), Smith et al.
patent: 5220274 (1993-06-01), Nightingale et al.
patent: 6175080 (2001-01-01), Nightingale
patent: 6218826 (2001-04-01), Nightingale
patent: 6466000 (2002-10-01), Nightingale
U.S. Trademark Electronic Search results indicating Tektronix, Inc. filed an Intent to Use trademark application for the word mark TEKCONNECT to describe electrical/mechanical probe interfaces for osicilloscopes and oscilloscope probes on Feb. 10, 2000, (3 pages).
“The Legacy of Innovation Lives On . . . EDN 2000 Innovation of the Year Award Bestowed Upon Tektronix,” and article found at www.tek.com, having the date of Apr. 10, 2001. (2 pages).
“Tektronix Strengthens Innovative Oscilloscope Portfolio With NewPrice/ Performance Model,” an article found at www.tek.com., having the date of May 31, 2001. (2 pages).
Tektronix Data Sheet, 3 GHz Differential Probes: P7330 * P6330. This data sheet was found at www.tek.com. Aug. 2000 appears to be the date it was published. (2 pages).
Deposito, Joe, “Real-Time Scope Breaks Into 4-GHz Territory With Fast SiGe Technology,” an article found at www.planetee.com indicating that it was published by Electronic Design on Jun. 12, 2000. (3 pages).
Tektronix Instruction Manual for the P7330 3.5 GHz Differential Probe. No copyright date could be found, but applicants had it in their posession around or about May 2001. Attached are the first 3 pages of the manual as well as pp. 49-54.
Campbell Julie A.
Sekel Stephen Mark
Sula Stanley Joseph
Cuneo Kamand
LeCroy Corporation
Oster Karen Dana
Patel Paresh
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