Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2005-03-08
2005-03-08
Williams, Alexander Oscar (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S676000, C257S703000, C257S700000, C257SE21505, C257SE23054, C257SE23072, C257SE23169, C257S701000, C257S702000, C257S771000, C257S773000, C257S772000, C257S762000, C257S765000, C148S033300, C156S278000
Reexamination Certificate
active
06864579
ABSTRACT:
A carrier has a metal area that is essentially composed of copper. A chip has a rear side metallization layer. A buffer layer, essentially composed of nickel and having a thickness of between 5 μm and 10 μm, is arranged on the metal area. The chip does not have a chip housing and is arranged on the metal area, which has been provided with the buffer layer, such that only one connecting medium is arranged between the rear side metallization layer of the chip and the buffer layer.
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Gross Kurt
Rappl Hans
Greenberg Laurence A.
Mayback Gregory L.
Stemer Werner H.
Williams Alexander Oscar
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