Carrier module for semiconductor device test handler

Details Carrier module for semiconductor device test handler Carrier module for semiconductor device test handler

2005-03-29

2005-03-29

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C324S758010

Reexamination Certificate

active

06873169

ABSTRACT:
Carrier module for a semiconductor device test handler including a carrier module body, a device seating part in an underside part of the carrier module body, at least one pair of first latches at opposite sides of the device seating part arranged opposite to, and movable away from, or close to, each other, for holding, or releasing opposite side parts of the semiconductor device seated on the device seating part, at least one pair of second latches rotatably fitted on opposite sides of the first latch, for holding an underside part of the semiconductor device seated on the device seating part, and releasing the semiconductor device interlocked with a releasing action of the first latch, a latch button fitted in an upper part of the carrier module to move in up/down directions and coupled to one end of the first latch, for moving up and down to make the first latch to move, and a first elastic member, and a second elastic member for elastic supporting of the first latch, and the second latch, thereby securely holding, transferring, and bringing the semiconductor device into contact with the test socket, for testing.

REFERENCES:
patent: 6512388 (2003-01-01), Satoh et al.
patent: 6741089 (2004-05-01), Conroy
patent: 6752645 (2004-06-01), Nakamura et al.

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