Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-02-26
1998-12-01
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
439266, G01R 3102, G01R 1073
Patent
active
058444181
ABSTRACT:
A carrier for testing a singularized semiconductor die prior to packaging the die utilizes a removable die supporting substrate. The die is placed in the carrier and is electrically connected to the substrate, thereby allowing for the packaging or other use of only known good die. A bridge clamp presses against a rigid cover which, in turn, bias the die against a plurality of die contacting members located on the die supporting substrate. The use of the removable die supporting substrate permits a single carrier design to accommodate different die types and further permits handling equipment to mechanically handle the one carrier design. This facilitates the handling of the carrier so that the carrier can be conveniently used during burn-in and test procedures.
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Cloud et al., Equipment, Processes and Method For High Volume KGD Production, Third Annual Manufacturing Test Conference, Semicon West, 1996 .
Farnworth Warren M.
Wood Alan G.
Gratton Stephen A.
Karlsen Ernest F.
Micro)n Technology, Inc.
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