Card controlled beta backscatter thickness measuring instrument

Details Card controlled beta backscatter thickness measuring instrument Card controlled beta backscatter thickness measuring instrument

1975-11-12

1978-03-14

Smith, Jerry

Boots, shoes, and leggings

235492, 250308, 364527, G06F 1552, G01N 23203

Patent

active

040792374

ABSTRACT:
An improved beta backscatter instrument for the non-destructive measurement of the thickness of thin coatings on a substrate. Included therein is the utilization of a bank of memory stored data representative of isotope, substrate, coating material and thickness range characteristics in association with a control card having predetermined indicia thereon selectively representative of a particular isotope, substrate material, coating material and thickness range for conditioning electronic circuit means by memory stored data selected in accord with the predetermined indicia on a control card for converting backscattered beta particle counts into indicia of coating thickness.

REFERENCES:
patent: 3171100 (1965-02-01), Rajchman
patent: 3332071 (1967-07-01), Goldman et al.
patent: 3412249 (1968-11-01), Hanken
patent: 3639763 (1972-02-01), Streng
patent: 3742217 (1973-06-01), Eakman et al.
patent: 3775595 (1973-11-01), Rosse et al.
patent: 3829844 (1974-08-01), Zonneveld et al.
patent: 3854042 (1974-12-01), Ott

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