Carbon nanotube oscillator surface profiling device and...

Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their...

Reexamination Certificate

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C850S033000, C073S105000

Reexamination Certificate

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08060943

ABSTRACT:
The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.

REFERENCES:
patent: 6666075 (2003-12-01), Mancevski et al.
Giessibl, Advances in Atomic Force Microscopy, Reviews of Modern Physics, 2003, vol. 75, pp. 949-983.
Chen, et al., Dependence of Workfunction on the Geometries of Single-Walled Carbon Nanotubes, Nanotechnology, 2004, vol. 15, pp. 480-484.
Kang, et al., Electrostatically Telescoping Nanotube Nonvolatile Memory Device, Nanotechnology, 2007, vol. 18, pp. 1-8.
Zheng, et al., Multiwalled Carbon Nanotubes as Gigahertz Oscillators, Physical Review Letters, 2002, vol. 88, No. 4, pp. 045503-1-045503-3.
Cumings, et al., Low-Friction Nanoscale Linear Bearing Realized from Multiwall Carbon Nanotubes, Science, 2000, vol. 289, pp. 602-604.
Ozer, et al., Measurement of Energy Dissipation Between Tungsten Tip and Si(1 0 0)-(2×1) Using Sub-Angstrom Oscillation Amplitude Non-Contact Atomic Force Microscope, Applied Surface Science, 2003, vol. 210, pp. 12-17.
Zhao, et al., Energy Dissipation Mechanisms in Carbon Nanotube Oscillators, Physical Review Letters, 2003, vol. 91, No. 17, pp. 175504-1-175504-4.
Rudolf, et al., Vibrational Dynamics of Fullerene Molecules Absorbed on Metal Surfaces Studied with Synchrotron Infrared Radiation, Applied Physics A, vol. 75, pp. 147-153.
Rivera, et al., Oscillatory Behavior of Double-Walled Nanotubes Under Extension: A Simple Nanoscale Damped Spring, Nano Letters, 2003, vol. 3, No. 8, pp. 1001-1005.
Kis, et al., Interlayer Forces and Ultralow Sliding Friction in Multiwalled Carbon Nanotubes, Physical Review Letters, 2006, vol. 97, pp. 025501-1-025501-4.
Guo, et al., Energy Dissipation in Gigahertz Oscillators from Multiwalled Carbon Nanotubes, Physical Review Letters, 2003, vol. 91, No. 12, pp. 125501-1-125501-4.
Trevethan, et al., Physical Dissipation Mechanisms in Non-Contact Atomic Force Microscopy, Nanotechnology, 2004, vol. 15, pp. S44-S48.
Volokitin, et al., Near-Field Radiative Heat Transfer and Noncontact Friction, Reviews of Modern Physics, 2007, vol. 79, pp. 1291-1329.
Tomassone, et al., Dominance of Phonon Friction for a Xenon Film on a Silver (111) Surface, Physical Review Letters, 1997, vol. 79, No. 24, pp. 4798-4801.
Persson, et al., Brownian Motion and Vibrational Phase Relaxation at Surfaces: CO on Ni(111), Physical Review B, 1985, vol. 32, No. 6, pp. 3586-3596.
Boutchko, et al., Dynamics of Monolayer Xenon Absorbed on Pt(111), Physical Review B, 2004, vol. 70, pp. 195422-1-195422-6.
Boutchko, et al., Brownian Friction of Gas Molecules on the Graphite Surface, Physical Review B, 1999, vol. 59, No. 16, pp. 10 992-10 995.
Gauthier et al., Theory of Energy Dissipation into Surface Vibrations, Noncontact Atomic Force Microscopy, 2002, Chapter 19, Berlin: Springer, pp. 371-394.
Saito et al., Structure of a Single-Wall Carbon Nanotube, Physical Properties of Carbon Nanotubes, 1998, Imperial College Press, Chapter 3, pp. 35-58.
Gradshteyn et al., Tables of Integrals, Series, and Products, 1965, Academic Press, New York, 6th Edition, pp. 948-949 and pp. 1040-1044.

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