Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their...
Reexamination Certificate
2009-08-26
2011-11-15
Johnston, Phillip A (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
General aspects of spm probes, their manufacture, or their...
C850S033000, C073S105000
Reexamination Certificate
active
08060943
ABSTRACT:
The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.
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Bondarev Igor V.
Popescu Adrian
Woods Lilia M.
Johnston Phillip A
North Carolina Central University
Sauter Molly L.
Smith & Hopen , P.A.
University of South Florida
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