Carbon nanotube detection system

Measuring and testing – Surface and cutting edge testing – Roughness

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C850S040000, C850S058000, C977S742000, C977S842000, C977S876000

Reexamination Certificate

active

07610797

ABSTRACT:
A carbon nanotube detection system is disclosed. The detection system is suitable to detect carbon nanotube vibrations. Types of detection systems include but are not limited to: magnetic coupling to a magnetic particle attached at the distal end of the nanotube oscillator, current readout from the nanotube oscillator that has been exposed to electromagnetic radiation or a stress, inductive pick-up coil and corresponding tank circuit, capacitive readout element positioned next to the nanotube oscillator having a charged particle attached at its distal end, an optical beam illumination and detection of its scattering, or combination of any of the above means of detection.

REFERENCES:
patent: 4883959 (1989-11-01), Hosoki et al.
patent: 5171992 (1992-12-01), Clabes et al.
patent: 5267471 (1993-12-01), Abraham et al.
patent: 5394741 (1995-03-01), Kajimura et al.
patent: 5461907 (1995-10-01), Tench et al.
patent: 5468959 (1995-11-01), Tohda et al.
patent: 5503010 (1996-04-01), Yamanaka
patent: 5515719 (1996-05-01), Lindsay
patent: 5519212 (1996-05-01), Elings et al.
patent: 5611942 (1997-03-01), Mitsui et al.
patent: 5646339 (1997-07-01), Bayer et al.
patent: 5670712 (1997-09-01), Cleveland et al.
patent: 5760300 (1998-06-01), Kajimura et al.
patent: 5918274 (1999-06-01), Chen et al.
patent: 6006593 (1999-12-01), Yamanaka
patent: 6094972 (2000-08-01), Yasutake et al.
patent: 6314800 (2001-11-01), Nishimura
patent: 6346189 (2002-02-01), Dai et al.
patent: 6911646 (2005-06-01), Weitekamp
patent: 2004/0168527 (2004-09-01), Nakayama et al.
patent: 19822634 (1999-11-01), None
patent: 913508 (1999-05-01), None
patent: WO 98/05920 (1998-02-01), None
Wong, S.S. et al., “Carbon Nanotube Tips: High-Resolution Probes for Imaging Biological Systems”, Journal of Americal Chemical Society, vol. 120, 1998, pp. 603-604.
Dai, H. et al., “Nanotubes as Nanoprobes in Scanning Probe Microscopy”, Nature, vol. 384, 1996, pp. 147-151.
Nagy, G. et al., “Carbon Nanotube Tipped Atomic Force Microscopy for Measurement of < 100 nm Etch Morphology on Semiconductors”, Applied Physics Letters, vol. 73, No. 4, Jul. 1998, pp. 529-531.
Cheung, C.L. et al. “Carbon Nanotube Atomic Force Microscopy Tips: Direct Growth b y Chemical Vapor Deposition and Application to High-Resolution Imaging”, Proc. Natl. Acad. S vol. 97, No. 8, Apr. 2000, pp. 3809-3813.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Carbon nanotube detection system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Carbon nanotube detection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Carbon nanotube detection system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4131909

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.