Capacity measuring device and capacity measuring method

Details Capacity measuring device and capacity measuring method Capacity measuring device and capacity measuring method

2005-03-01

2005-03-01

Le, N. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S658000, C324S548000

Reexamination Certificate

active

06861849

ABSTRACT:
The capacity measuring device comprises a transistor (40) formed on a silicon substrate and having a drain, source, and gate regions (41, 42, and43), extension metals (51-54) to be connected to the regions, a guard electrode (55) surrounding the extension metal (53) for the gate region, measurement pads (61-64) electrically connected to the extension metals, the guard rings (61g-64g) surrounding the measurement pads and connected to the guard electrode (55). Accordingly, the infinitesimal capacity between any regions of the transistor in full scale is accurately measured by connecting the guard electrode (55) to a guard terminal of an infinitesimal capacity measuring apparatus for canceling the parasitic capacity.

REFERENCES:
patent: 6348809 (2002-02-01), Hirota et al.
patent: 2000-55956 (2000-02-01), None

Affiliated with

Also associated with

Rating

Capacity measuring device and capacity measuring method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Capacity measuring device and capacity measuring method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Capacity measuring device and capacity measuring method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3393101