Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-10-10
2010-11-09
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S678000, C341S120000
Reexamination Certificate
active
07830159
ABSTRACT:
A method for calibrating a capacitor mismatch error between a sampling capacitor and a feedback capacitor in a switched capacitor circuit includes sampling a fixed input voltage onto the sampling capacitor during a sampling phase of the switched capacitor circuit; placing the switched capacitor circuit in a hold/amplification phase of the switched capacitor circuit; providing a pair of level shift voltages alternately to the first plate of the sampling capacitor; generating a pair of output voltages at an output terminal of an amplifier where the pair of output voltages are a function of the sampled fixed input voltage, amplified by the amplifier and level shifted by the pair of level shift voltages and the pair of output voltages resemble output voltages in normal operation of the switched capacitor circuit; and comparing the pair of output voltages with respective corresponding ideal output voltages values to determine the capacitor mismatch error.
REFERENCES:
patent: 6617992 (2003-09-01), Sakurai
patent: 6891486 (2005-05-01), Pentakota et al.
patent: 6956519 (2005-10-01), Huang et al.
patent: 6963300 (2005-11-01), Lee
patent: 7187318 (2007-03-01), Lee et al.
Cook Carmen C.
National Semiconductor Corporation
Nguyen Vincent Q
Patent Law Group LLP
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