Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1997-12-04
2000-03-28
Do, Diep N.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324548, G01R 2728, G01R 3112
Patent
active
060436654
ABSTRACT:
A method for accurately measuring the insulation resistance of a capacitor while reducing time taken for the measurement. To this end, a current calculation equation is first obtained based on an equivalent circuit of a capacitor; then, the calculation equation is modified or corrected based on the degree of coincidence between an actually measured current value m(t) and a calculated current value i(t), the former being within a charge-up region of a dielectric polarization component upon initial application of a voltage; next, the current value at a time point of chargeup termination is predicted or estimated by use of this modified calculation equation.
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patent: 5510719 (1996-04-01), Yamamoto
patent: 5677634 (1997-10-01), Cooke et al.
Kitagawa Mitsuru
Nishimura Masao
Nishioka Yoshinao
Tabata Toshinari
Do Diep N.
Murata Manufacturing Co. Ltd.
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