Capacitor and method for fabricating the same

Semiconductor device manufacturing: process – Making passive device

Reexamination Certificate

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C438S387000, C438S396000, C257S532000

Reexamination Certificate

active

07871889

ABSTRACT:
A capacitor includes a lower electrode, a first dielectric layer formed over the lower electrode, a second dielectric layer formed over the first dielectric layer, wherein the second dielectric layer includes an amorphous high-k dielectric material, a third dielectric layer formed over the second dielectric layer, and an upper electrode formed over the third dielectric layer.

REFERENCES:
patent: 6730573 (2004-05-01), Ng et al.
patent: 7723770 (2010-05-01), Choi et al.
patent: 2003/0062558 (2003-04-01), Yang et al.
patent: 2006/0234466 (2006-10-01), Jeong et al.
patent: 1020060052474 (2006-05-01), None
patent: 1020060102470 (2006-09-01), None
patent: 100648860 (2006-11-01), None
patent: 1020070027789 (2007-03-01), None
Korean Intellectual Property Office, Notice of Preliminary Rejection, Application No. 10-2007-0026087, Feb. 21, 2008.

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