Semiconductor device manufacturing: process – Making passive device
Reexamination Certificate
2011-01-18
2011-01-18
Wojciechowicz, Edward (Department: 2895)
Semiconductor device manufacturing: process
Making passive device
C438S387000, C438S396000, C257S532000
Reexamination Certificate
active
07871889
ABSTRACT:
A capacitor includes a lower electrode, a first dielectric layer formed over the lower electrode, a second dielectric layer formed over the first dielectric layer, wherein the second dielectric layer includes an amorphous high-k dielectric material, a third dielectric layer formed over the second dielectric layer, and an upper electrode formed over the third dielectric layer.
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Korean Intellectual Property Office, Notice of Preliminary Rejection, Application No. 10-2007-0026087, Feb. 21, 2008.
Hynix / Semiconductor Inc.
Townsend and Townsend / and Crew LLP
Wojciechowicz Edward
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