Capacitor and diode circuitry for on chip power spike detection

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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361111, 365190, G01R 3102

Patent

active

054771510

ABSTRACT:
A memory cell system with properties of asymmetrical operation such that the occurrence of memory error due to certain environmental disturbances is detectable. The asymmetry of operation can be adjusted to set the level at which the disturbance is detected. Detection of memory error in the system can be used to shut off access to an associated memory array in order to prevent error in the array.

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patent: 4999728 (1991-03-01), Curl
patent: 5053996 (1991-10-01), Stemmen
patent: 5070426 (1991-12-01), Iwasa et al.
patent: 5084873 (1992-01-01), Houston
patent: 5157335 (1992-10-01), Houston
patent: 5361033 (1994-11-01), Houston

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