Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-07-05
2005-07-05
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S076520, C324S072500, C702S072000
Reexamination Certificate
active
06914439
ABSTRACT:
Method and apparatus for accurately determining the presence of voltage at capacitive test points and for determining the phase angle relationship between two capacitive points. The detection of the presence of the voltage at the capacitive test points is independent of the voltage range in the systems, independent of the contamination or defects that may occur in the capacitive test point systems. The phase angle relationship is determined based on the actual phase angle difference between the voltage waveforms at the capacitive test points independent of the capacitive divider ratio difference and the capacitive test point voltage accuracy.
REFERENCES:
patent: 3392334 (1968-07-01), Bevins
patent: 3866117 (1975-02-01), Erdman
patent: 4016492 (1977-04-01), Miller et al.
patent: 4316254 (1982-02-01), Levin
patent: 4492918 (1985-01-01), Hernandez et al.
patent: 5136234 (1992-08-01), Shaw
patent: 6126462 (2000-10-01), Lam
Hoffman & Baron LLP
Nguyen Vincent Q.
Thomas & Betts International Inc.
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