Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1988-08-30
1990-07-31
Myracle, Jerry W.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
361294, G01B 722
Patent
active
049441817
ABSTRACT:
A capacitive strain gage includes a housing attachable to a test specimen at a first location and a ground plane attachable to the test specimen at a second location. The housing and the ground plane are movable relative to each other. A passage extends through the housing between opposing spaced-apart surfaces. First and second excitation electrodes are located on one of the surface, and a third signal electrode is located on the other of the surfaces. The electrodes each have fixed positions on the housing. Each of the first and second electrodes is positioned for capacitive coupling to the third electrode. The ground plane includes an arm that extends into the passage in the housing. The arm includes an aperture for electric fields that is aligned with the electrodes in a quiescent position. The aperture is sized and shaped such that when strain in the test specimen causes relative movement of the housing and the arm, the capacitive coupling between the third electrode and at least one of the first and second electrodes is changed. The capacitive strain gage can have a planar or an annular configuration.
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J. M. Nielsen, "A Hermetically Sealed High Temperature Capacitive Strain Gage Design", date unknown.
Hitec Products, Inc.
Myracle Jerry W.
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