Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1996-10-28
1998-05-12
Brock, Michael
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
7351432, G01P 15125
Patent
active
057511543
ABSTRACT:
In a switched-capacitor type interface circuit connected to a capacitive sensor having two capacitors (C1, C2) whose value is variable, the interface circuit includes an operational amplifier (A1) with an output terminal and an inverting input terminal between which a feedback/sampling capacitor (C3) is connected, and a holding capacitor (C4) connected between the operational amplifier (A1) and a reference voltage source. The capacitors (C1, C2, C3) have one ends connected to the inverting input terminal of the operational amplifier (A1). The other ends of the capacitors (C1, C2) are connected to a power source and the capacitor (C3) is concurrently short-circuited depending upon predetermined timing, and the other ends of the and capacitors (C1, C2) and the output terminal of the operational amplifier (A1) are respectively connected to a non-inverting input terminal of the operational amplifier (A1) after the elapse of a predetermined time from the predetermined timing.
REFERENCES:
patent: 5429736 (1995-07-01), Shimada et al.
patent: 5612494 (1997-03-01), Shibano
"An ASIC for High-Resoilution Capacitive Microaccelerometerss", Sensors and Actuators, A21-A23, pp. 278-281, 1990.
Brock Michael
Mitsubishi Denki & Kabushiki Kaisha
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