Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-06-14
2005-06-14
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
06906529
ABSTRACT:
Each pixel of an array has a subarray of upper capacitor plates located just beneath a sensing surface. The upper plates may be square and laid out in an equal number of rows and columns. Each upper plate can be selectively electrically connected to one of two lower capacitor plates according to the state of a memory cell, such as an SRAM memory cell, associated with each upper plate. The upper plate/lower plate interconnections can be configured in predetermined different patterns of the upper plates in successive sensing operations to improve the accuracy of capacitively sensing of an object, such as a human fingerprint, applied to the sensing surface above the pixel array.
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patent: 6114862 (2000-09-01), Tartagni
patent: 6525547 (2003-02-01), Hayes
patent: 6636053 (2003-10-01), Gozzini
He Amy
Jorgenson Lisa K.
Nguyen Vincent Q.
STMicroelectronics Inc.
Thoma Peter J.
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