Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-01-18
2005-01-18
Zarneke, David A. (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S658000, C073S30400R
Reexamination Certificate
active
06844743
ABSTRACT:
Capacitive probe measuring the level, in a vessel and with high precision, of the interface between a conducting fluid (F1) and a non-conducting fluid (a gas or oil for example), suited to work under high pressure and high temperature conditions. The probe comprises a preferably tubular insulating layer (3) made of a dielectric heat-resisting material (a metal oxide such as zirconia or alumina) baked at a high temperature, with a first face in contact with conducting fluid (Fl) and an opposite face in contact with a second electrode (4), consisting for example of a coating or of a layer made of a fusible alloy deposited on the opposite face of insulant (3), selected according to the temperature range within which the capacitive probe is intended to work, or possibly of an added tube. Alloys based on zinc, tin, copper, etc, can for example be used. A second capacitor of the same type used for temperature compensation of the first one can be placed within the tubular insulating layer. Its capacitance is for example of the order of 1 nF. The probe can be applied in laboratory apparatuses working under high pressure and high temperature conditions, notably in petrophysical test cells.
REFERENCES:
patent: 3433072 (1969-03-01), Virtanen et al.
patent: 3569824 (1971-03-01), Ruse
patent: 3891465 (1975-06-01), Muto et al.
patent: 3956760 (1976-05-01), Edwards
patent: 3998441 (1976-12-01), Schuster et al.
patent: 4023096 (1977-05-01), Schmidt
patent: 4054744 (1977-10-01), Beaman
patent: 4112197 (1978-09-01), Metz
patent: 4449405 (1984-05-01), Franz et al.
patent: 4457170 (1984-07-01), Thrift et al.
patent: 5212992 (1993-05-01), Calhoun et al.
patent: 5315872 (1994-05-01), Moser
patent: 5688384 (1997-11-01), Hodgson et al.
patent: 5907112 (1999-05-01), Queyquep
patent: 01 01 580 (1984-02-01), None
patent: 04 70 483 (1992-02-01), None
patent: 09 26 474 (1999-06-01), None
patent: 11 76 914 (1970-01-01), None
“The Sixth International meeting on Chemical Sensors”, Jul. 22-25, 1996, by Howard H. Weetall. NIST, Gaithersburg, MD, USA.
Chaput Christophe
Lenormand Roland
Antonelli Terry Stout & Kraus LLP
Patel Paresh
Zarneke David A.
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