Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-08-16
2005-08-16
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S686000
Reexamination Certificate
active
06930494
ABSTRACT:
A novel capacitive sensor assembly that utilizes a flex circuit for amplification of capacitively sensed signals and for separating the power, ground, and measurement signals is presented. The use of a flex circuit in the capacitive probe assembly allows implementation of multiple capacitive sensors for respectively capacitively coupling multiple signals from respective multiple test points of a circuit under test. The invention integrates the sensor plate, amplifier, and return wiring for each capacitive sensor all onto one flex circuit.
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Crook David T.
Tesdahl Curtis A.
Agilent Technologie,s Inc.
Nguyen Vincent Q.
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