Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-07-26
2011-07-26
Nguyen, Hoai-An D (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S658000
Reexamination Certificate
active
07986152
ABSTRACT:
In one embodiment, a sensor includes a substrate; multiple interconnected sense elements arranged in a first direction on a surface of the substrate; and first interconnected drive elements arranged on a surface of the substrate in the first direction. Each respective one of the first interconnected drive elements are located adjacent to and between respective ones of the sense elements to form first sets of sense and drive elements alternating in the first direction. The sensor also includes second interconnected drive elements arranged on a surface of the substrate in a second direction. Each respective one of the second interconnected drive elements are located between respective ones of the sense elements to form second sets of sense and drive elements alternating in the second direction.
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Bowens Alan
Brunet Samuel
Philipp Harald
Trend Matthew
Atmel Corporation
Baker & Botts L.L.P.
Nguyen Hoai-An D
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