Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-05-02
1992-06-16
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324605, 324681, 34087037, G01R 2726
Patent
active
051227550
ABSTRACT:
A differential capacitive pickoff detector circuit for measuring the difference in spacing of a pair of differential pickoff capacitor plates. Current sources are provided for each output terminal of each of the pair of differential capacitors so that for each capacitor output terminal a current signal alternates between a first current level and a second current level at a predetermined carrier clock switching rate. The capacitors are varied to provide DSB-LC voltage signals across each of the capacitors. The average value of each of the alternating voltages and their amplitudes are automatically adjusted to predetermined levels. The two DSB-LC voltage signals are combined to provide a DSB-SC signal. The DSB-SC signal is synchronously demodulated using a quadrature reference carrier clock signal to provide an output baseband signal which represents the difference between the spacing of the first and second differential capacitor plates.
REFERENCES:
patent: 4122708 (1978-10-01), Maier
patent: 4165483 (1979-08-01), Holdren et al.
patent: 4206400 (1980-06-01), Holdren et al.
patent: 4483194 (1984-11-01), Rudolf
patent: 4743838 (1988-05-01), Eckerle
Newell Gerald R.
Nootbaar Michael W.
Harvey Jack B.
New SD Inc.
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