Capacitive open-circuit test employing threshold determination

Details Capacitive open-circuit test employing threshold determination Capacitive open-circuit test employing threshold determination

1994-01-27

1995-02-21

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324519, 324537, 324679, G01R 2726, G01R 3104

Patent

active

053919939

ABSTRACT:
In a method for testing whether a pin (12) of an electronic component (14) on a circuit board under test (18) has been properly connected to a circuit-board track (16), a source (20) drives the track (16), and a capacitive probe (34) located above the component (14) generates a resultant output. The pin (12) is determined to be connected correctly if that output exceeds a threshold determined for that pin (12) during a training process in which similar measurements have been made on a known good board for that pin and other pins on the same electronic device. The threshold is determined by dividing the capacitance measurement made during the training process for that pin into connection-dependent and connection-independent parts, the latter being the part that would result even in the absence of a proper pin connection. Determination of the pin-independent part is made, without disconnecting the pin in question, by operations that take advantage of symmetries in the pattern of lead-frame conductors predominately responsible for the connection-dependent component of the measured capacitance. The threshold is the sum of the connection-independent part and a percentage of the connection-dependent part.

REFERENCES:
patent: 4583042 (1986-04-01), Riemer
patent: 5124660 (1992-06-01), Cilingiroglu
patent: 5150047 (1992-09-01), Saito et al.
patent: 5254953 (1993-10-01), Crook et al.

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