Capacitive microsensor

Image analysis – Applications – Personnel identification

Reexamination Certificate

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Details

C356S071000, C348S294000, C438S524000

Reexamination Certificate

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07130455

ABSTRACT:
A capacitive microsensor formed on a wafer, including a conductive detection area arranged on a first surface or front surface of the wafer; a conductive via crossing the wafer and emerging on said area; and a structure to ensure contact with said via on the second surface or rear surface of the wafer.

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patent: 6307258 (2001-10-01), Crane et al.
patent: 6317508 (2001-11-01), Kramer et al.
patent: 6563215 (2003-05-01), Akram et al.
patent: 6838362 (2005-01-01), Mastromatteo et al.
patent: 2001/0043728 (2001-11-01), Kramer et al.
French Search Report from French Patent Application 01/03471, filed Mar. 14, 2001.

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