Image analysis – Applications – Personnel identification
Reexamination Certificate
2006-10-31
2006-10-31
Mehta, Bhavesh M. (Department: 2624)
Image analysis
Applications
Personnel identification
C356S071000, C348S294000, C438S524000
Reexamination Certificate
active
07130455
ABSTRACT:
A capacitive microsensor formed on a wafer, including a conductive detection area arranged on a first surface or front surface of the wafer; a conductive via crossing the wafer and emerging on said area; and a structure to ensure contact with said via on the second surface or rear surface of the wafer.
REFERENCES:
patent: 5270710 (1993-12-01), Gaultier et al.
patent: 5757081 (1998-05-01), Chang et al.
patent: 5778089 (1998-07-01), Borza
patent: 5862248 (1999-01-01), Salatino et al.
patent: 5956415 (1999-09-01), McCalley et al.
patent: 6088471 (2000-07-01), Setlak et al.
patent: 6307258 (2001-10-01), Crane et al.
patent: 6317508 (2001-11-01), Kramer et al.
patent: 6563215 (2003-05-01), Akram et al.
patent: 6838362 (2005-01-01), Mastromatteo et al.
patent: 2001/0043728 (2001-11-01), Kramer et al.
French Search Report from French Patent Application 01/03471, filed Mar. 14, 2001.
Jorgenson Lisa K.
Mehta Bhavesh M.
Morris James H.
STMicroeletronics S.A.
Strege John
LandOfFree
Capacitive microsensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Capacitive microsensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Capacitive microsensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3630306