Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-08-29
2006-08-29
Benson, Walter (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S662000, C324S690000
Reexamination Certificate
active
07098673
ABSTRACT:
The invention relates to a measuring device including at least one measuring probe, sequentially applying a controlled supply voltage between the measuring probe and a reference element, and integrating accumulated electric charges on the measuring probe. The device also includes at least one auxiliary measuring probe, which is also sequentially linked to a controlled electric supply and to charge integrating means. The auxiliary measuring probe has a capacity, in relation to a potential detection zone, which is different from the main measuring probe. Comparative use of signals respectively emitted by the two measuring probes enables the influence of the main measuring probe to be determined.
REFERENCES:
patent: 4451780 (1984-05-01), Ogasawara
patent: 6545603 (2003-04-01), Launay et al.
patent: 6637276 (2003-10-01), Adderton et al.
Da Silva Joaquim
Jordana Pascal
Launay Claude
Le Reste Daniel
Pancirol William
Benson Walter
Blakely & Sokoloff, Taylor & Zafman
Hitachi Computer Product (Europe) S.A.S.
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