Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1988-05-24
1990-01-09
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324686, 324688, 34087037, G01B 730, G08C 1910
Patent
active
048930717
ABSTRACT:
A capacitance based, high resolution, incrementally encoding, position measuring system employs an array of identical replicated electrodes that are driven in unison from an RF source and mounted in proximity to a patterned monolithic reference ground plane of arbitrary size. Motion of such position-sensing arrays is monitored by measuring both the sums and the differences of the electrode displacement currents in such a way as to provide incrementally encoding position signals in both one and two dimensions together with a continuous measurement of the height of the sensor array above the patterned ground plane. In various modifications, the system and methods are applied both to one dimensional linear, as well as to two dimensional planar and two dimensional cylindrical motion measurement and control. Various techniques for eliminating the effects of spurious capacitances are also disclosed.
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"The Design and Application of Capacitance Micrometers" by R. V. Jones and J. C. S. Richards, Journal of Physics E, Science Instruments, vol. 6, Series 2, 1973, pp. 589-600.
"The Precise Measurement of Small Capacitances" by A. M. Thompson, IRE Transactions on Instrumentation, vol. 1-7, 1958, pp. 245-253.
American Telephone and Telegraph Company AT&T Bell Laboratories
Eisenzopf Reinhard J.
Ryan William
Solis Jose M.
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