Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1989-12-01
1991-11-12
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324684, 324688, G01R 2726
Patent
active
050651056
ABSTRACT:
A capacitive dimensional measurement chain with linear output is essentia comprised of a capacitive sensor formed by a central detection electrode and a guard electrode surrounding the detection electrode that are respectively powered by two a.c. bias voltage sources. The chain also comprises a reference capacitor and a measuring circuit for measuring the distance between the detection electrode and a conductive part placed facing the detection electrode. The bias voltage sources are variable level sources and are level-controlled by a distance measurement signal issued by the measuring circuit. The measuring circuit comprises a level amplifier and a demodulator for amplifying and demodulating an incoming error signal representative of a difference between a load of a sensor capacitance that is defined between the detection electrode and the part separated by the distance to be measured, and a load of the reference capacitor. The distance measurement signal supplied by the measuring circuit linearly represents the distance to be measured.
REFERENCES:
patent: 4067225 (1978-01-01), Dorman et al.
patent: 4176555 (1979-12-01), Dorman
patent: 4539835 (1985-09-01), Shambroom et al.
Bruere Alain
Galaud Claude
Harvey Jack B.
Office National d'Etudes et de Recherches Aerospatiales O.N.E.R.
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