Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-10-25
2005-10-25
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S662000, C073S862043
Reexamination Certificate
active
06958614
ABSTRACT:
In a capacitance type sensor of the present invention, a capacitance element is constituted between a displacement electrode and a capacitance element electrode. A return-switch movable electrode is arranged above and spaced from the displacement electrode, to be placed in contact with the displaying electrode due to a displacement of a direction button. When the direction button is operated, the return-switch movable electrode is first displaced into contact with the displacement electrode. Then, the both make a displacement while keeping a contact state. When the displacement electrode is displaced to change the spacing to the capacitance element electrode, changed is the capacitance value of the capacitance element. Based on this change, a force is recognized. Herein, in the course of a transit from a state the displacement electrode and the return-switch electrode are not in contact to a state of their contact, the output signal varies necessarily beyond a threshold voltage.
REFERENCES:
patent: 6158291 (2000-12-01), Okada
patent: 6159761 (2000-12-01), Okada
patent: 6373265 (2002-04-01), Morimoto et al.
patent: 6530283 (2003-03-01), Okada et al.
patent: WO 02/073148 (2002-09-01), None
Deb Anjan
Natalini Jeff
Nitta Corporation
Osha & Liang LLP
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