Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-01-24
2006-01-24
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C073S780000
Reexamination Certificate
active
06989677
ABSTRACT:
Capacitance element electrodes (E1to E5) and a grounded reference electrode (E0) are formed on a substrate (20). At a position opposite to these electrodes (E0to E5), a displacement electrode (40) is disposed that is Z-axially deformable as a detective member (30) is externally operated to move Z-axially. The displacement electrode (40) cooperates with the reference electrode (E0) and capacitance element electrodes (E1to E5) to form capacitance elements (C0to C5), respectively. Each of the capacitance elements (C1to C5) is connected in series with the capacitance element (C0) with respect to a signal externally input. Changes in the capacitance values of the capacitance elements (C1to C5) as the detective member (30) is moved are detected to sense the displacement of the detective member (30).
REFERENCES:
patent: 4606132 (1986-08-01), Briney et al.
patent: 5180986 (1993-01-01), Swartz et al.
patent: 5450594 (1995-09-01), Aden et al.
patent: 6003371 (1999-12-01), Okada
patent: 6053057 (2000-04-01), Okada
patent: 6076401 (2000-06-01), Okada
patent: 6098461 (2000-08-01), Okada
patent: 6158291 (2000-12-01), Okada
patent: 6159761 (2000-12-01), Okada
patent: 6205856 (2001-03-01), Okada
patent: 6282956 (2001-09-01), Okada
patent: 6378381 (2002-04-01), Okada et al.
patent: 6464411 (2002-10-01), Yoshida et al.
patent: 6530283 (2003-03-01), Okada et al.
patent: 6867602 (2005-03-01), Davis et al.
patent: 6882164 (2005-04-01), Yano et al.
patent: 6900644 (2005-05-01), Chou et al.
patent: 6910385 (2005-06-01), Shkel
patent: 6-139880 (1994-05-01), None
patent: 6-323939 (1994-11-01), None
patent: 6-324801 (1994-11-01), None
patent: 8-123613 (1996-05-01), None
patent: 10-141992 (1998-05-01), None
patent: 11-2504 (1999-01-01), None
patent: 2000-292271 (2000-10-01), None
Deb Anjan
Nguyen Hoai-An D
Nitta Corporation
Osha & Liang LLP
LandOfFree
Capacitance type sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Capacitance type sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Capacitance type sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3552680