Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-08-23
2005-08-23
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S662000, C073S862043
Reexamination Certificate
active
06933732
ABSTRACT:
A movable switch electrode (E21) which is contactable with a capacitance element electrode (E1) formed on a substrate (20) and is spaced apart from a fixed switch electrode (E11) formed in an interior of the capacitance element electrode (E1) and having a domed form to cover the fixed switch electrode (E11) is set in place. When a detective member (30) is operated and a force applied from a displacement electrode (40) to the movable switch electrode (E21) reaches a specified value, the movable switch electrode (E21) is elastically deformed and depressed drastically with buckling at the nearly top portion thereof and is brought into contact with the fixed switch electrode (E11). This brings the switch into the ON-state. At this time, an operator is given a pronounced click feeling.
REFERENCES:
patent: 5367199 (1994-11-01), Lefkowitz et al.
patent: 6530283 (2003-03-01), Okada et al.
patent: 11-132872 (1999-05-01), None
patent: 3069594 (2000-03-01), None
Deb Anjan
Dole Timothy J.
Nitta Corporation
Osha & Liang LLP
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