Capacitance type sensor

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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Details

C324S661000, C073S862043

Reexamination Certificate

active

06842015

ABSTRACT:
A capacitance element electrode (E1) and a reference electrode (E31) are formed on a substrate (20) so as to be opposite to a displacement electrode (40). A dome-shaped movable switch electrode (E21) is disposed so as to be in contact with the reference electrode (E31) and at a distance from a fixed switch electrode (E11) formed inside the reference electrode (E31), and to cover the fixed switch electrode (E11). When an operation is applied to a detective member (30) and a portion of the movable switch electrode (E21) in the vicinity of its top is displaced to be brought into contact with fixed switch electrode (E11), a switch is turned ON. On the other hand, from a change in capacitance value of a capacitance element (C1) formed between the displacement electrode (40) and the capacitance element electrode (E1), the intensity of the force to the detective member (30) can be recognized.

REFERENCES:
patent: 4606132 (1986-08-01), Briney et al.
patent: 5367199 (1994-11-01), Lefkowitz et al.
patent: 6464411 (2002-10-01), Yoshida et al.
patent: 6530283 (2003-03-01), Okada et al.
patent: 11-132872 (1999-05-01), None
patent: 3069594 (2000-03-01), None
International Preliminary Examination Report, dated Oct. 4, 2001, 3 pages.

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