Capacitance type semiconductor dynamic quantity sensor

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element

Reexamination Certificate

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C073S504140

Reexamination Certificate

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10926137

ABSTRACT:
A capacitance type semiconductor dynamic quantity sensor includes a beam-shaped movable electrode displaceable in a predetermined direction in response to application of a dynamic quantity to a support substrate, and beam-shaped fixed electrodes which are fixedly supported on the support substrate and disposed so that the side surface thereof faces a side surface of the movable electrode. The applied dynamic quantity is detected on the basis of variation of electric capacitance between the side surface of the movable electrode and the side surface of the fixed electrodes. Countermeasures are included to prevent sticking between the fixed electrodes and the movable electrode.

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patent: A-11-304495 (1999-11-01), None

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