Capacitance type force sensors

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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Details

C324S662000

Reexamination Certificate

active

07119552

ABSTRACT:
Capacitance element electrodes (E1to E5) and a grounded reference electrode (E0) are formed on a substrate (20). A displacement electrode (40) that is Z-axially displaced in accordance with a Z-axial movement of a detective member (30) externally operated, is disposed so as to be opposed to the above electrodes (E0to E5). The displacement electrode (40) cooperates with the reference electrode (E0) and the capacitance element electrodes (E1to E5) to form capacitance elements (C0to C5), respectively. Each of the capacitance elements (C1to C5) is connected to the capacitance element (C0) in series in relation to an externally input signal. Changes in the capacitance values of the capacitance elements (C1to C5) when the detective member (30) is moved, is detected by a signal processing circuit having hysteretic characteristics. Thereby, the displacement of the detective member (30) is detected.

REFERENCES:
patent: 4719538 (1988-01-01), Cox
patent: 6989677 (2006-01-01), Morimoto
patent: 9-210723 (1997-08-01), None
patent: 9-229784 (1997-09-01), None
patent: 2001-108541 (2001-04-01), None
patent: 2002-131149 (2002-05-01), None
patent: 2003-35615 (2003-02-01), None
Patent Abstracts of Japan, Publication No. 2001-108541 dated Apr. 4, 2001, 2 pages.
Patent Abstracts of Japan, Publication No. 2003-035615 dated Feb. 7, 2003, 2 pages.
Patent Abstracts of Japan, Publication No. 2002-131149 dated May 9, 2002, 2 pages.
Patent Abstracts of Japan, Publication No. 09-229784 dated Sep. 5, 1997, 2 pages.
Patent Abstracts of Japan, Publication No. 09-210723 dated Aug. 15, 1997, 2 pages.

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