Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-06-28
2011-06-28
Dole, Timothy J (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C341S161000, C341S172000, C327S094000, C324S678000
Reexamination Certificate
active
07969167
ABSTRACT:
A capacitance-to-voltage interface circuit includes a capacitive sensing circuit, an amplification circuit adapted for selective coupling to the capacitive sensing circuit, a capacitor bank comprising a plurality of binary-weighted capacitors, and a switching architecture associated with the capacitive sensing circuit, the amplification circuit, and the capacitor bank. The switching architecture reconfigures the capacitance-to-voltage interface circuit for operation in a plurality of different phases, including an amplification phase and an analog-to-digital conversion phase. During the amplification phase, the capacitor bank is utilized for offsetting capacitance of the amplification circuit. During the analog-to-digital conversion phase, the capacitor bank is utilized in a successive approximation register.
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Jo Sung Jin
Khanna Ashish
Baldridge Benjamin M
Dole Timothy J
Freescale Semiconductor Inc.
Ingrassia Fisher & Lorenz P.C.
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