Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1989-05-26
1990-08-28
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324662, 324671, 324690, G01R 2726
Patent
active
049528823
ABSTRACT:
A capacitance sensor for measuring changes in thickness of a dielectric film, such as plastic film, passed through the sensor, having an upper and lower housing projecting from a back plate, the lower housing having an upper electrode surface and the upper housing having an insulator aligned with the electrode surface; the insulator having an electrode conneced to an electrical conductor; the materials for constructing the two housings, the electrode and the insulator all having a coefficient of linear temperature expansion of less than 1.times.10.sup.-6 per degree Centigrade.
REFERENCES:
patent: 3764899 (1973-10-01), Peterson et al.
patent: 3992665 (1976-11-01), Preikschat
patent: 4090359 (1978-05-01), Doellner
Mayer Daniel W.
Mayer William N.
Oestreich Roger
Eisenzopf Reinhard J.
Modern Controls Inc.
Mueller Robert W.
Sjoquist Paul L.
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