Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2009-09-30
2011-10-18
Johnson, Ryan (Department: 2817)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S658000, C331S143000, C331S046000
Reexamination Certificate
active
08040143
ABSTRACT:
Systems and methods are provided for determining the value of a capacitance. A system for sensing capacitance comprises an oscillator arrangement comprising a plurality of oscillators and a mismatch compensation arrangement coupled between the oscillator arrangement and a first capacitive element having a first capacitance. The mismatch compensation arrangement is configured to selectively couple the first capacitive element to a respective oscillator of the plurality of oscillators, wherein an oscillation frequency of the respective oscillator is influenced by the first capacitance.
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Freescale Semiconductor Inc.
Ingrassia Fisher & Lorenz P.C.
Johnson Ryan
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