Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1994-08-22
1997-02-11
Regan, Maura K.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324679, 327288, G01R 2726
Patent
active
056024878
ABSTRACT:
A capacitance measuring device comprises a MOS transistor having a source, drain, and gate; a first capacitor C.sub.1 connected between said gate and said drain so that charge is coupled from said drain onto said gate; and a second capacitor C.sub.2 for connection to a source of gate voltage V.sub.G and connected to said gate. One of the first and second capacitors has a known capacitance and the other has an unknown capacitance. A DC voltage is supplied between the source and drain to cause a saturation current to flow therebetween. The ratio .delta.V.sub.G /.delta.V.sub.d for the saturation current, where V.sub.G is the applied gate voltage, and V.sub.d is the drain voltage is determined and the unknown capacitance is derived from the relationship C.sub.1 /C.sub.2 =-.delta.V.sub.G /.delta.V.sub.d.
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Mitel Corporation
Regan Maura K.
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