Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-05-24
2011-11-08
Natalini, Jeff (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S519000, C341S143000
Reexamination Certificate
active
08054089
ABSTRACT:
The present invention is based on the finding that a capacitance can be measured precisely and efficiently when, in a delta-sigma modulator having an operational amplifier, a first capacitor connectable to an input of the operational amplifier, and a second capacitor in a feedback branch of the operational amplifier, a reference signal source is connectable to the first capacitor, wherein the first or second capacitor may represent a capacitance to be measured. Due to the fact that, in contrast to what is conventional, no input quantity is measured and digitalized at the input of the delta-sigma modulator, but instead a defined reference signal source is coupled at the input and a device of the delta-sigma modulator itself represents the measuring quantity, an extremely compact circuit is provided allowing capacitances to be measured quickly and reliably, the measuring result being additionally made available in a digital form.
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English translation of the official communication issued in counterpart International Application No. PCT/EP2006/004989, mailed on May 15, 2008.
Official communication issued in the International Application No. PCT/EP2006/004989, mailed on Aug. 14, 2006.
Official communication issued in the counterpart International Application No. PCT/EP2006/004989, mailed on Aug. 14, 2006.
Hartmann Marcus
Hauer Johann
Moedl Stefan
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung
Hoque Farhana
Keating & Bennett LLP
Natalini Jeff
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